Multi-Detector X-Ray Mapping and Generation of Correction Factor Images for Problem Solving

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dc.contributor.author Moran, Ken en_US
dc.contributor.author Wuhrer, Ric en_US
dc.contributor.author Phillips, Matt en_US
dc.contributor.editor en_US
dc.date.accessioned 2010-05-28T09:43:00Z
dc.date.available 2010-05-28T09:43:00Z
dc.date.issued 2008 en_US
dc.identifier 2008004067 en_US
dc.identifier.citation Wuhrer Richard, Moran Ken, and Phillips Matthew 2008, 'Multi-Detector X-Ray Mapping and Generation of Correction Factor Images for Problem Solving', Cambridge University Press, vol. 14, no. S2, pp. 1108-1109. en_US
dc.identifier.issn 1431-9276 en_US
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/8407
dc.description.abstract X-ray mapping with Silicon Drift detectors (SDD?s) and multi-EDS detector systems has become an invaluable analysis technique because the time to perform an x-ray map is reduced considerably. Live x-ray imaging can now been performed with so much data collected in a matter of minutes. The use of multi-EDS detector systems has made this form of mapping even quicker and has also given users the ability to map minor and trace elements very accurately. How the data is collected and summed with multi-EDS detectors is very critical for accurate quantitative x-ray mapping (QXRM). en_US
dc.language en_US
dc.publisher Cambridge University Press en_US
dc.title Multi-Detector X-Ray Mapping and Generation of Correction Factor Images for Problem Solving en_US
dc.parent Microscopy & Microanalysis en_US
dc.journal.volume 14 en_US
dc.journal.number S2 en_US
dc.publocation UK en_US
dc.identifier.startpage 1108 en_US
dc.identifier.endpage 1109 en_US
dc.cauo.name SCI.Faculty of Science en_US
dc.conference Verified OK en_US
dc.for 020400 en_US
dc.personcode 880536 en_US
dc.personcode 0000022654 en_US
dc.personcode 810070 en_US
dc.percentage 100 en_US
dc.classification.name Condensed Matter Physics en_US
dc.classification.type FOR-08 en_US
dc.edition en_US
dc.custom en_US
dc.date.activity en_US
dc.location.activity en_US
dc.description.keywords NA en_US
dc.staffid 810070 en_US


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