High bandwidth secondary electron detection in variable pressure scanning electron microscopy using a Frisch grid

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dc.contributor.author Morgan, Scott en_US
dc.contributor.author Phillips, Matt en_US
dc.contributor.editor en_US
dc.date.accessioned 2010-05-28T09:42:53Z
dc.date.available 2010-05-28T09:42:53Z
dc.date.issued 2008 en_US
dc.identifier 2008000205 en_US
dc.identifier.citation Morgan Scott and Phillips Matthew 2008, 'High bandwidth secondary electron detection in variable pressure scanning electron microscopy using a Frisch grid', IOP Publishing Ltd, vol. 41, no. 5, pp. 1-6. en_US
dc.identifier.issn 0022-3727 en_US
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/8392
dc.description.abstract The bandwidth and contrast of secondary electron ( SE) images obtained using variable pressure scanning electron microscopy are enhanced when a grounded Frisch grid is placed between the SE detecting anode and the negatively biased stage. The improvement en_US
dc.language en_US
dc.publisher IOP Publishing Ltd en_US
dc.title High bandwidth secondary electron detection in variable pressure scanning electron microscopy using a Frisch grid en_US
dc.parent Journal Of Physics D-Applied Physics en_US
dc.journal.volume 41 en_US
dc.journal.number 5 en_US
dc.publocation Bristol en_US
dc.identifier.startpage 1 en_US
dc.identifier.endpage 6 en_US
dc.cauo.name SCI.Faculty of Science en_US
dc.conference Verified OK en_US
dc.for 020400 en_US
dc.personcode 96088947 en_US
dc.personcode 810070 en_US
dc.percentage 100 en_US
dc.classification.name Condensed Matter Physics en_US
dc.classification.type FOR-08 en_US
dc.edition en_US
dc.custom en_US
dc.date.activity en_US
dc.location.activity ISI:000254153800050 en_US
dc.description.keywords Ion Recombination; Environmental Sem; Charge; Amplification; Contrast en_US
dc.staffid en_US
dc.staffid 810070 en_US


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