Identification And Distance Measures Of Measurement Apparatus

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Show simple item record Ji, Zhengfeng en_US Feng, Yuan en_US Duan, Runyao en_US Ying, Mingsheng en_US
dc.contributor.editor en_US 2010-05-28T09:42:21Z 2010-05-28T09:42:21Z 2006 en_US
dc.identifier 2008004793 en_US
dc.identifier.citation Ji Zhengfeng et al. 2006, 'Identification And Distance Measures Of Measurement Apparatus', American Physical Soc, vol. 96, no. 20, pp. 1-4. en_US
dc.identifier.issn 0031-9007 en_US
dc.identifier.other C1UNSUBMIT en_US
dc.description.abstract We propose simple schemes that can perfectly identify projective measurement apparatuses secretly chosen from a finite set. Entanglement is used in these schemes both to make possible the perfect identification and to improve the efficiency significantly en_US
dc.language en_US
dc.publisher American Physical Soc en_US
dc.relation.hasversion Accepted manuscript version en_US
dc.title Identification And Distance Measures Of Measurement Apparatus en_US
dc.parent Physical Review Letters en_US
dc.journal.volume 96 en_US
dc.journal.number 20 en_US
dc.publocation College Pk en_US
dc.identifier.startpage 1 en_US
dc.identifier.endpage 4 en_US FEIT.School of Systems, Management and Leadership en_US
dc.conference Verified OK en_US
dc.for 010503 en_US
dc.personcode 0000049993 en_US
dc.personcode 106439 en_US
dc.personcode 106353 en_US
dc.personcode 103396 en_US
dc.percentage 100 en_US Mathematical Aspects of Classical Mechanics, Quantum Mechanics and Quantum Information Theory en_US
dc.classification.type FOR-08 en_US
dc.edition en_US
dc.custom en_US en_US
dc.location.activity en_US
dc.description.keywords NA en_US
dc.staffid 103396 en_US

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