A Bayesian/Maximum Entropy Method for Certification of a Nanocrystalline-Size NIST Reference Material

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dc.contributor.author Armstrong, Nicholas en_US
dc.contributor.author Kalceff, Walter en_US
dc.contributor.author Cline, James en_US
dc.contributor.author Bonevich, John en_US
dc.contributor.editor Scardi, P. en+US
dc.contributor.editor Mittemeijer EJ; Scardi P en_US
dc.date.accessioned 2009-06-26T04:18:15Z
dc.date.available 2009-06-26T04:18:15Z
dc.date.issued 2004 en_US
dc.identifier 2004000366 en_US
dc.identifier.citation Armstrong Nicholas et al. 2004, 'A Bayesian/Maximum Entropy Method for Certification of a Nanocrystalline-Size NIST Reference Material', in NA (ed.), Springer Verlag, Berlin, Germany, pp. 187-227. en_US
dc.identifier.issn 3-540-40519-4 en_US
dc.identifier.other B1 en_US
dc.identifier.uri http://hdl.handle.net/10453/804
dc.description.abstract NA en_US
dc.publisher Springer Verlag en_US
dc.relation.isbasedon NA en_US
dc.title A Bayesian/Maximum Entropy Method for Certification of a Nanocrystalline-Size NIST Reference Material en_US
dc.parent Diffraction Analysis of the Microstructure of Materials en_US
dc.publocation Berlin, Germany en_US
dc.identifier.startpage 187 en_US
dc.identifier.endpage 227 en_US
dc.cauo.name SCI.Physics and Advanced Materials en_US
dc.conference Verified OK en_US
dc.for 020400 en_US
dc.personcode 921034 en_US
dc.personcode 800088 en_US
dc.personcode 0000021075 en_US
dc.personcode 0000021076 en_US
dc.percentage 100 en_US
dc.classification.name Condensed Matter Physics en_US
dc.classification.type FOR-08 en_US
dc.edition 1 en_US
dc.description.keywords NA en_US


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