A Bayesian/Maximum Entropy Method for Certification of a NanocrystallineSize NIST Reference Material
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| dc.contributor.author | Kalceff Walter | en_US |
| dc.contributor.author | Cline James | en_US |
| dc.contributor.author | Armstrong Nicholas | en_US |
| dc.contributor.author | Bonevich John | en_US |
| dc.contributor.editor | Mittemeijer, E. J. | en_US |
| dc.contributor.editor | Scardi, P. | en+US |
| dc.date.accessioned | 2009-06-26T04:18:15Z | |
| dc.date.available | 2009-06-26T04:18:15Z | |
| dc.date.issued | 2004 | en_US |
| dc.identifier | 2004000366 | en_US |
| dc.identifier.citation | Armstrong Nicholas et al. 2004, 'A Bayesian/Maximum Entropy Method for Certification of a Nanocrystalline-Size NIST Reference Material', in NA (ed.), Springer Verlag, Berlin, Germany, pp. 187-227. | en_US |
| dc.identifier.issn | 3540405194 | en_US |
| dc.identifier.other | B1 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10453/804 | |
| dc.publisher | Springer Verlag | en_US |
| dc.relation.isbasedon | http://www.springer.com/materials/book/9783540405191 | en_US |
| dc.title | A Bayesian/Maximum Entropy Method for Certification of a NanocrystallineSize NIST Reference Material | en_US |
| dc.parent | Diffraction Analysis of the Microstructure of Materials | en_US |
| dc.journal.volume | NA | en_US |
| dc.journal.number | NA | en_US |
| dc.publocation | Berlin Germany | en_US |
| dc.identifier.startpage | 187 | en_US |
| dc.identifier.endpage | 227 | en_US |
| dc.cauo.name | Physics and Advanced Materials | en_US |
