X-ray Mapping using Multiple EDS and WDS Detectors

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dc.contributor.author Moran, Ken en_US
dc.contributor.author Davey, P en_US
dc.contributor.author Wuhrer, Ric en_US
dc.contributor.author Phillips, Matt en_US
dc.contributor.editor R. Price et al. en_US
dc.date.accessioned 2009-06-26T04:16:22Z
dc.date.available 2009-06-26T04:16:22Z
dc.date.issued 2005 en_US
dc.identifier 2006009801 en_US
dc.identifier.citation Wuhrer Richard et al. 2005, 'X-ray Mapping using Multiple EDS and WDS Detectors', Cambridge University Press, United Kingdom, pp. 1678-1679. en_US
dc.identifier.issn 1431-9276 en_US
dc.identifier.other E1UNSUBMIT en_US
dc.identifier.uri http://hdl.handle.net/10453/789
dc.description.abstract High quality x-ray mapping (XRM) has been used for over 30 years by experienced wavelength dispersive spectroscopy (WDS) operators. Manufacturers have been developing similar techniques using energy dispersive spectroscopy (EDS) over the last 20 years. This has been generally unsuccssful due to a number of problems such as poor computer specifications, cost, time to map and generally poor peak to bacjground ratios (P:B). With improvements in all the above parameters EDS mapping is now gaining in popularity. en_US
dc.publisher Cambridge University Press en_US
dc.relation.isbasedon http://dx.doi.org/10.1017/S1431927605504859 en_US
dc.title X-ray Mapping using Multiple EDS and WDS Detectors en_US
dc.parent Proceeding Microscopy and Microanalysis Vol 11 (Suppl2) en_US
dc.journal.volume en_US
dc.journal.volume 11 en_US
dc.journal.number en_US
dc.publocation United Kingdom en_US
dc.identifier.startpage 1678 en_US
dc.identifier.endpage 1679 en_US
dc.cauo.name SCI.Physics and Advanced Materials en_US
dc.conference Verified OK en_US
dc.conference.location Honolulu USA en_US
dc.for 100700 en_US
dc.personcode 880536 en_US
dc.personcode 0000022654 en_US
dc.personcode 810070 en_US
dc.personcode 0000029701 en_US
dc.percentage 100 en_US
dc.classification.name Materials Engineering en_US
dc.classification.type FOR-08 en_US
dc.custom Microscopy and Microanalysis en_US
dc.date.activity 20050731 en_US
dc.location.activity Honolulu, USA en_US
dc.description.keywords NA en_US


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