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| dc.contributor.author | Wuhrer Richard | en_US |
| dc.contributor.author | Moran Ken | en_US |
| dc.contributor.author | Phillips Matthew | en_US |
| dc.contributor.author | Davey P | en_US |
| dc.contributor.editor | R. Price et al. | en_US |
| dc.date.accessioned | 2009-06-26T04:16:22Z | |
| dc.date.available | 2009-06-26T04:16:22Z | |
| dc.date.issued | 2005 | en_US |
| dc.identifier | 2006009801 | en_US |
| dc.identifier.citation | Wuhrer Richard et al. 2005, 'X-ray Mapping using Multiple EDS and WDS Detectors', Cambridge University Press, United Kingdom, pp. 1678-1679. | en_US |
| dc.identifier.issn | 1431-9276 | en_US |
| dc.identifier.other | E1 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10453/789 | |
| dc.publisher | Cambridge University Press | en_US |
| dc.relation.isbasedon | http://dx.doi.org/10.1017/S1431927605504859 | en_US |
| dc.title | X-ray Mapping using Multiple EDS and WDS Detectors | en_US |
| dc.parent | Proceeding Microscopy and Microanalysis Vol 11 (Suppl2) | en_US |
| dc.journal.volume | en_US | |
| dc.journal.number | en_US | |
| dc.publocation | United Kingdom | en_US |
| dc.identifier.startpage | 1678 | en_US |
| dc.identifier.endpage | 1679 | en_US |
| dc.cauo.name | Physics and Advanced Materials | en_US |
| dc.conference | Microscopy and Microanalysis 2005 | en_US |
| dc.conference.location | Honolulu USA | en_US |
