Direct Comparison of Various Gaseous Secondary Electron Detectors in the Variable Pressure Scanning Electron Microscope
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| dc.contributor.author | Phillips Matthew | en_US |
| dc.contributor.author | Morgan Scott | en_US |
| dc.contributor.editor | R. Price et al. | en_US |
| dc.date.accessioned | 2009-06-26T04:16:21Z | |
| dc.date.available | 2009-06-26T04:16:21Z | |
| dc.date.issued | 2005 | en_US |
| dc.identifier | 2006009794 | en_US |
| dc.identifier.citation | Phillips Matthew and Morgan Scott 2005, 'Direct Comparison of Various Gaseous Secondary Electron Detectors in the Variable Pressure Scanning Electron Microscope', Cambridge University Press, United Kingdom, pp. 398-399. | en_US |
| dc.identifier.issn | 1431-9276 | en_US |
| dc.identifier.other | E1 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10453/787 | |
| dc.publisher | Cambridge University Press | en_US |
| dc.relation.isbasedon | http://dx.doi.org/10.1017/S1431927605507992 | en_US |
| dc.title | Direct Comparison of Various Gaseous Secondary Electron Detectors in the Variable Pressure Scanning Electron Microscope | en_US |
| dc.parent | Proceeding Microscopy and Microanalysis vol 11 (Suppl 2) | en_US |
| dc.journal.volume | en_US | |
| dc.journal.number | en_US | |
| dc.publocation | United Kingdom | en_US |
| dc.identifier.startpage | 398 | en_US |
| dc.identifier.endpage | 399 | en_US |
| dc.cauo.name | Physics and Advanced Materials | en_US |
| dc.conference | Microscopy and Microanalysis 2005 | en_US |
| dc.conference.location | Honolulu Hawaii | en_US |
