| dc.contributor.author | Khushaba Rami N | en_US |
| dc.contributor.author | Al-Ani Ahmed | en_US |
| dc.contributor.author | Al-Jumaily Adel | en_US |
| dc.contributor.editor | en_US | |
| dc.date.accessioned | 2010-05-28T09:38:04Z | |
| dc.date.available | 2010-05-28T09:38:04Z | |
| dc.date.issued | 2009 | en_US |
| dc.identifier | 2009003037 | en_US |
| dc.identifier.citation | Khushaba Rami N, Al-Ani Ahmed, and Al-Jumaily Adel 2009, 'Feature Subset Selection Using Differential Evolution', in http://dx.doi.org/10.1007/978-3-642-02490-0_13 (ed.), Springer Berlin / Heidelberg, Germany, pp. 103-110. | en_US |
| dc.identifier.issn | 978-3-642-02489-4 | en_US |
| dc.identifier.other | B1 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10453/7833 | |
| dc.description.abstract | One of the fundamental motivations for feature selection is to overcome the curse of dimensionality. A novel feature selection algorithm is developed in this chapter based on a combination of Differential Evolution (DE) optimization technique and statistical feature distribution measures. The new algorithm, referred to as DEFS, utilizes the DE float number optimizer in a combinatorial optimization problem like feature selection. The proposed DEFS highly reduces the computational cost while at the same time proves to present a powerful performance. The DEFS is tested as a search procedure on different datasets with varying dimensionality. Practical results indicate the significance of the proposed DEFS in terms of solutions optimality and memory requirements. | en_US |
| dc.language | en_US | |
| dc.publisher | Springer Berlin / Heidelberg | en_US |
| dc.relation.isbasedon | http://dx.doi.org/10.1007/978-3-642-02490-0_13 | en_US |
| dc.title | Feature Subset Selection Using Differential Evolution | en_US |
| dc.parent | Advances in Neuro-Information Processing - Lecture Notes in Computer Science | en_US |
| dc.journal.volume | en_US | |
| dc.journal.number | en_US | |
| dc.publocation | Germany | en_US |
| dc.identifier.startpage | 103 | en_US |
| dc.identifier.endpage | 110 | en_US |
| dc.cauo.name | FEIT.School of Elec, Mech and Mechatronic Systems | en_US |
| dc.conference | Verified OK | en_US |
| dc.for | 080109 | en_US |
| dc.personcode | 011083;040052;101188 | en_US |
| dc.percentage | 000040 | en_US |
| dc.classification.name | Pattern Recognition and Data Mining | en_US |
| dc.classification.type | FOR-08 | en_US |
| dc.edition | First Edition | en_US |
| dc.custom | en_US | |
| dc.date.activity | en_US | |
| dc.location.activity | en_US | |
| dc.description.keywords | en_US | |
| dc.staffid | en_US |