X-ray mapping using a multiple-EDS (DUAL) detector

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dc.contributor.author Wuhrer, Richard en_US
dc.contributor.author Moran, Ken en_US
dc.contributor.author Phillips, Matthew en_US
dc.contributor.author Davey, P en_US
dc.contributor.editor Kotula P, Marko M, Scott JH, Gauvin R, Beniac D, Lucas G, McKernan S, Shields J en_US
dc.date.accessioned 2009-06-26T04:12:59Z
dc.date.available 2009-06-26T04:12:59Z
dc.date.issued 2006 en_US
dc.identifier 2006005776 en_US
dc.identifier.citation Wuhrer Richard et al. 2006, 'X-ray mapping using a multiple-EDS (DUAL) detector', Cambridge University Press, USA, pp. 1406-1407. en_US
dc.identifier.issn 1431-9276 en_US
dc.identifier.other E1 en_US
dc.identifier.uri http://hdl.handle.net/10453/775
dc.description.abstract X-ray mapping (XRM) is an extremely useful problem solving tool. However, the two major problems for energy dispersive spectroscopy are interpretation of results under non ideal conditions (strong overlap and small peak size relative to background), and the time required to obtain a good quality 256x256 pixel map (1 to 3 hours). XRM has been considered a slow technique, claiming many hours of SEM time and often relegated to out-of-hours (overnight) mapping. With the development of high count rate silicon high resolution drift detectors (SDD) [1, 2] and multi-detector systems [3], the time required to acquire XRM decreases. With a single EDS detector at 20kcps output, a good 512x512 quantitative map can be obtained in around 4 to 8 hours for major elements (>10wt% evenly distributed) and minor elements (>1wt% localised). en_US
dc.publisher Cambridge University Press en_US
dc.relation.isbasedon http://dx.doi.org/10.1017/S143192760606243X en_US
dc.title X-ray mapping using a multiple-EDS (DUAL) detector en_US
dc.parent Proceedings of Microscopy & Microanalysis 12, suppl. 2, 2006 en_US
dc.publocation USA en_US
dc.identifier.startpage 1406 en_US
dc.identifier.endpage 1407 en_US
dc.cauo.name SCI.Physics and Advanced Materials en_US
dc.conference Verified OK en_US
dc.for 029904 en_US
dc.personcode 880536 en_US
dc.personcode 0000022654 en_US
dc.personcode 810070 en_US
dc.personcode 0000029701 en_US
dc.percentage 60 en_US
dc.classification.name Synchrotrons; Accelerators; Instruments and Techniques en_US
dc.classification.type FOR-08 en_US
dc.custom Microscopy & Microanalysis en_US
dc.date.activity 20060730 en_US
dc.location.activity Chicago USA en_US


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