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| dc.contributor.author | Wuhrer Richard | en_US |
| dc.contributor.author | Moran Ken | en_US |
| dc.contributor.author | Phillips Matthew | en_US |
| dc.date.accessioned | 2009-06-26T04:12:57Z | |
| dc.date.available | 2009-06-26T04:12:57Z | |
| dc.date.issued | 2006 | en_US |
| dc.identifier | 2006005777 | en_US |
| dc.identifier.citation | Wuhrer Richard, Moran Ken, and Phillips Matthew 2006, 'X-ray mapping and post processing', Cambridge university Press, USA, pp. 1404-1405. | en_US |
| dc.identifier.issn | 1052-1053 | en_US |
| dc.identifier.other | C1 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10453/756 | |
| dc.publisher | Cambridge University Press | en_US |
| dc.relation.isbasedon | http://dx.doi.org/10.1017/S1431927606062428 | en_US |
| dc.title | X-ray mapping and post processing | en_US |
| dc.parent | Microscopy and Microanalysis 12 Suppl. 2, 2010 | en_US |
| dc.journal.volume | 12 | en_US |
| dc.journal.number | S2 | en_US |
| dc.publocation | New York | en_US |
| dc.identifier.startpage | 1404 | en_US |
| dc.identifier.endpage | 1405 | en_US |
| dc.cauo.name | Physics and Advanced Materials | en_US |
