| dc.contributor.author | Anstis Geoffrey | en_US |
| dc.date.accessioned | 2009-06-26T04:12:57Z | |
| dc.date.available | 2009-06-26T04:12:57Z | |
| dc.date.issued | 2004 | en_US |
| dc.identifier | 2004001227 | en_US |
| dc.identifier.citation | Anstis Geoffrey 2004, 'The 1s-state analysis applied to high angle annular dark field image interpretation - when can we use it?', Cambridge University Press, vol. 10, no. 1, pp. 4-8. | en_US |
| dc.identifier.issn | 1431-9276 | en_US |
| dc.identifier.other | C1 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10453/755 | |
| dc.description.abstract | A small probe centered on an atomic column excites the bound and unbound states of the two-dimensional projected potential of the column. It has been argued that, even when several states are excited, only the 1s state is sufficiently localized to contribute a signal to the high-angle detector. This article shows that non-1s states do make a significant contribution for certain incident probe profiles. The contribution of the 1s state to the thermal diffuse scattering is calculated directly. Sub-Ångstrom probes formed by Cs-corrected lenses excite predominantly the 1s state and contributions from other states are not very large. For probes of lower resolution when non-1s states are important, the integrated electron intensity at the column provides a better estimate of image intensity. | en_US |
| dc.publisher | Cambridge University Press | en_US |
| dc.relation.isbasedon | http://dx.doi.org/10.1017/S1431927604040255 | en_US |
| dc.title | The 1s-State Analysis Applied to High-Angle, Annular Dark-Field Image Interpretation: When Can We Use It? | en_US |
| dc.parent | Microscopy And Microanalysis | en_US |
| dc.journal.volume | 10 | en_US |
| dc.journal.number | 1 | en_US |
| dc.publocation | New York | en_US |
| dc.identifier.startpage | 4 | en_US |
| dc.identifier.endpage | 8 | en_US |
| dc.cauo.name | Physics and Advanced Materials | en_US |