The 1s-state analysis applied to high angle annular dark field image interpretation - when can we use it?

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dc.contributor.author Anstis, Geoffrey en_US
dc.date.accessioned 2009-06-26T04:12:57Z
dc.date.available 2009-06-26T04:12:57Z
dc.date.issued 2004 en_US
dc.identifier 2004001227 en_US
dc.identifier.citation Anstis Geoffrey 2004, 'The 1s-state analysis applied to high angle annular dark field image interpretation - when can we use it?', Cambridge University Press, vol. 10, no. 1, pp. 4-8. en_US
dc.identifier.issn 1431-9276 en_US
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/755
dc.description.abstract A small probe centered on an atomic column excites the bound and unbound states of the two-dimensional projected potential of the column. It has been argued that, even when several states are excited, only the 1s state is sufficiently localized to contribute a signal to the high-angle detector. This article shows that non-1s states do make a significant contribution for certain incident probe profiles. The contribution of the 1s state to the thermal diffuse scattering is calculated directly. Sub-?ngstrom probes formed by Cs-corrected lenses excite predominantly the 1s state and contributions from other states are not very large. For probes of lower resolution when non-1s states are important, the integrated electron intensity at the column provides a better estimate of image intensity. en_US
dc.publisher Cambridge University Press en_US
dc.relation.isbasedon http://dx.doi.org/10.1017/s1431927604040255 en_US
dc.title The 1s-state analysis applied to high angle annular dark field image interpretation - when can we use it? en_US
dc.parent Microscopy & Microanalysis en_US
dc.journal.volume 10 en_US
dc.journal.number 1 en_US
dc.publocation New York, USA en_US
dc.identifier.startpage 4 en_US
dc.identifier.endpage 8 en_US
dc.cauo.name SCI.Physics and Advanced Materials en_US
dc.conference Verified OK en_US
dc.for 020500 en_US
dc.personcode 840027 en_US
dc.percentage 100 en_US
dc.classification.name Optical Physics en_US
dc.classification.type FOR-08 en_US
dc.description.keywords High resolution electron microscopy, scanning transission electron microscopy, high-angle annular dark-field imaging, 1s state, termal diffuse scattering, multislice metod, frozen phonon en_US
dc.staffid 840027 en_US


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