Enhanced high speed SE imaging using a VPSEM using a Frisch Grid

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dc.contributor.author Morgan, Scott en_US
dc.contributor.author Phillips, Matt en_US
dc.contributor.editor Kotula P, marko M, Scott JH, gauvin R, Beniac D, Lucas G, McKernan S, Shields J en_US
dc.date.accessioned 2009-06-26T04:12:53Z
dc.date.available 2009-06-26T04:12:53Z
dc.date.issued 2006 en_US
dc.identifier 2006005773 en_US
dc.identifier.citation Phillips Matthew and Morgan Scott 2006, 'Enhanced high speed SE imaging using a VPSEM using a Frisch Grid', Cambridge university Press, USA, pp. 1480-1481. en_US
dc.identifier.issn 1431-9276 en_US
dc.identifier.other E1 en_US
dc.identifier.uri http://hdl.handle.net/10453/707
dc.description.abstract Secondary electron (SE) imaging in a variable pressure SEM has necessitated the development of new detector technologies. One approach is to measure the charge, Q, induced on a positive electrode placed at some distance, r, from the specimen stage which is a ground potential. Gas ionization by sufficiently energetic SEs produces electron-ion pairs which are charge separated by the applied electric field. Electrons drift towards the anode causing further gas ionization in a cascade process, and the ions drift towards the stage (cathode). The total Q induced at the anode will include charge components induced by the motion of both electrons, QE, and ions, QI. en_US
dc.publisher Cambridge university Press en_US
dc.relation.isbasedon http://dx.doi.org/10.1017/S1431927606069522 en_US
dc.title Enhanced high speed SE imaging using a VPSEM using a Frisch Grid en_US
dc.parent Proceedings of Microscopy & Microanalysis 12, Suppl. 2 2006 en_US
dc.publocation USA en_US
dc.identifier.startpage 1480 en_US
dc.identifier.endpage 1481 en_US
dc.cauo.name SCI.Physics and Advanced Materials en_US
dc.conference Verified OK en_US
dc.for 029904 en_US
dc.personcode 810070 en_US
dc.personcode 96088947 en_US
dc.percentage 100 en_US
dc.classification.name Synchrotrons; Accelerators; Instruments and Techniques en_US
dc.classification.type FOR-08 en_US
dc.custom Microscopy & Microanalysis en_US
dc.date.activity 20060730 en_US
dc.location.activity Chicago, USA en_US
dc.staffid 040207 en_US


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