Dynamic Value-Based Diagnosis System for Assembler Program

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dc.contributor.author Lin, Li en_US
dc.contributor.author Jiang, Yunfei en_US
dc.contributor.author Fan, Zhoufu en_US
dc.contributor.author Zhang, Chengqi en_US
dc.contributor.editor Trave-Massueys,L. en_US
dc.date.accessioned 2010-05-18T06:48:09Z
dc.date.available 2010-05-18T06:48:09Z
dc.date.issued 2004 en_US
dc.identifier 2004001341 en_US
dc.identifier.citation Lin Li et al. 2004, 'Dynamic Value-Based Diagnosis System for Assembler Program', LAAS-CNRS, France, pp. 209-213. en_US
dc.identifier.issn en_US
dc.identifier.issn - en_US
dc.identifier.other E1 en_US
dc.identifier.uri http://hdl.handle.net/10453/6734
dc.publisher LAAS-CNRS en_US
dc.relation.isbasedon http://www.laas.fr/DX04/ en_US
dc.title Dynamic Value-Based Diagnosis System for Assembler Program en_US
dc.parent 15th International Workshop on Principle of Diagnosis DX04 en_US
dc.journal.volume en_US
dc.journal.number en_US
dc.publocation France en_US
dc.identifier.startpage 209 en_US
dc.identifier.endpage 213 en_US
dc.cauo.name FEIT.School of Systems, Management and Leadership en_US
dc.conference en_US
dc.conference Verified OK en_US
dc.conference.location Carcassonne, France en_US
dc.for 080109 en_US
dc.personcode 10082206 en_US
dc.personcode 0000022729 en_US
dc.personcode 0000022731 en_US
dc.personcode 011221 en_US
dc.percentage 70 en_US
dc.classification.name Pattern Recognition and Data Mining en_US
dc.classification.type FOR-08 en_US
dc.custom International Workshop on Principles of Diagnosis en_US
dc.date.activity 20040623 en_US
dc.location.activity Carcassonne, France en_US
dc.staffid 011221 en_US


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