Abstract:
Cathodoluminescence (CL) microscopy and
spectroscopy are enabling techniques for the microcharacterisation
of technologically important materials.
Recent advances in SEM instrumentation have
considerably expanded the microanalytical capabilities
of the CL technique. In this paper, following a brief
overview of the principles and practice of CL microscopy
and spectroscopy, a number of examples are
presented that demonstrate the utility of the technique
for the microcharacterisation of advanced optoelectronic
materials.