Implications of polishing techniques in quantitative X-ray microanalysis
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| dc.contributor.author | Nockolds Clive | en_US |
| dc.contributor.author | Phillips Matthew | en_US |
| dc.contributor.author | Remond Guy | en_US |
| dc.contributor.author | Roques-Carmes Claude | en_US |
| dc.date.accessioned | 2009-12-21T03:53:20Z | |
| dc.date.available | 2009-12-21T03:53:20Z | |
| dc.date.issued | 2002 | en_US |
| dc.identifier | 2004003042 | en_US |
| dc.identifier.citation | Remond Guy et al. 2002, 'Implications of polishing techniques in quantitative X-ray microanalysis', US Govt. Printing Office, vol. 107, no. 6, pp. 639-662. | en_US |
| dc.identifier.issn | 1044-677X | en_US |
| dc.identifier.other | C1 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10453/5865 | |
| dc.description.abstract | Specimen preparation using abrasives results in surface and subsurface mechanical (stresses, strains), geometrical (roughness), chemical (contaminants, reaction products) and physical modifications (structure, texture, lattice defects). The mechanisms involved in polishing with abrasives are presented to illustrate the effects of surface topography, surface and subsurface composition and induced lattice defects on the accuracy of quantitative x-ray microanalysis of mineral materials with the electron probe microanalyzer (EPMA). | en_US |
| dc.publisher | US Government Printing Office | en_US |
| dc.relation.isbasedon | http://nvl.nist.gov/pub/nistpubs/jres/107/6/cnt107-6.htm | en_US |
| dc.title | Implications of polishing techniques in quantitative X-ray microanalysis | en_US |
| dc.parent | Journal of Research of the national Institute of Standards and technology | en_US |
| dc.journal.volume | 107 | en_US |
| dc.journal.number | 6 | en_US |
| dc.publocation | Washington DC | en_US |
| dc.identifier.startpage | 639 | en_US |
| dc.identifier.endpage | 662 | en_US |
| dc.cauo.name | Science | en_US |
