Implications of polishing techniques in quantitative X-ray microanalysis

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dc.contributor.author Remond, Guy en_US
dc.contributor.author Nockolds, Clive en_US
dc.contributor.author Roques-Carmes, Claude en_US
dc.contributor.author Phillips, Matt en_US
dc.date.accessioned 2009-12-21T03:53:20Z
dc.date.available 2009-12-21T03:53:20Z
dc.date.issued 2002 en_US
dc.identifier 2004003042 en_US
dc.identifier.citation Remond Guy et al. 2002, 'Implications of polishing techniques in quantitative X-ray microanalysis', US Govt. Printing Office, vol. 107, no. 6, pp. 639-662. en_US
dc.identifier.issn 1044-677X en_US
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/5865
dc.publisher US Govt. Printing Office en_US
dc.relation.isbasedon http://dx.doi.org/10.6028/jres.107.052 en_US
dc.title Implications of polishing techniques in quantitative X-ray microanalysis en_US
dc.parent Journal of Research of the national Institute of Standards and technology en_US
dc.journal.volume 107 en_US
dc.journal.number 6 en_US
dc.publocation Washington DC en_US
dc.identifier.startpage 639 en_US
dc.identifier.endpage 662 en_US
dc.cauo.name SCI.Faculty of Science en_US
dc.conference Verified OK en_US
dc.for 020400 en_US
dc.personcode 0000023502 en_US
dc.personcode 0000023417 en_US
dc.personcode 810070 en_US
dc.personcode 0000023418 en_US
dc.percentage 80 en_US
dc.classification.name Condensed Matter Physics en_US
dc.classification.type FOR-08 en_US


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