Decomposition of wavelength dispersive X-ray spectra

Abstract

Line shapes of atomic lines and soft x-ray emission bands measured with a wavelength dispersive spectrometer (WDS) with the Electron Probe Micro Analyzer (EPMA) are reviewed. Least square fitting to pseudo-Voigt profiles of the digitally measured spectra are used to account for the presence of non-diagram features (high and low energy satellites) and instrumental induced distortions. The effect of line width and relative intensities on the quality of fits is illustrated. Spectral distortions resulting from the presence of absorption edges within the analyzed wavelength region are illustrated for the case of FeL ab emission bands for pure Fe and iron oxides. For quantitative analysis, an analytical approach is presented where the measured soft x-ray emission bands are corrected for self absorption before extracting the intensities from the experimental data.