Bayesian inference of nanoparticles-broadened X-ray line profiles
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| dc.contributor.author | Bonevich, J. E. | en_US |
| dc.contributor.author | Armstrong, N. G. | en_US |
| dc.contributor.author | Cline, J. P. | en_US |
| dc.contributor.author | Kalceff, W. | en_US |
| dc.date.accessioned | 2009-12-21T03:53:20Z | |
| dc.date.available | 2009-12-21T03:53:20Z | |
| dc.date.issued | 2004 | en_US |
| dc.identifier | 2004001539 | en_US |
| dc.identifier.citation | Armstrong, N. et al. 2004 'Bayesian inference of nanoparticles-broadened X-ray line profiles', Journal of Research of the National Institute of Standards and Technology, vol. 109, no. 1, pp. 155-178. | en_US |
| dc.identifier.issn | 1044-677X | en_US |
| dc.identifier.other | C1 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10453/5862 | |
| dc.description.abstract | A single-step, self-contained method for determining the crystallite-size distribution and shape from experimental x-ray line profile data is presented. It is shown that the crystallite-size distribution can be determined without invoking a functional form for the size distribution, determining instead the size distribution with the least assumptions by applying the Bayesian/MaxEnt method. The Bayesian/MaxEnt method is tested using both simulated and experimental CeO2 data, the results comparing favourably with experimental CeO2 data from TEM measurements. | en_US |
| dc.publisher | US Government Printing Office | en_US |
| dc.relation.isbasedon | http://nvl.nist.gov/pub/nistpubs/jres/109/1/cnt109-1.htm | en_US |
| dc.title | Bayesian inference of nanoparticles-broadened X-ray line profiles | en_US |
| dc.parent | Journal of Research of the National Institute of Standards and Technology | en_US |
| dc.journal.volume | 109 | en_US |
| dc.journal.number | 1 | en_US |
| dc.publocation | Washington DC | en_US |
| dc.identifier.startpage | 155 | en_US |
| dc.identifier.endpage | 178 | en_US |
| dc.cauo.name | Science | en_US |
