Bayesian inference of nanoparticles-broadened X-ray line profiles

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dc.contributor.author Bonevich, J. E. en_US
dc.contributor.author Armstrong, N. G. en_US
dc.contributor.author Cline, J. P. en_US
dc.contributor.author Kalceff, W. en_US
dc.date.accessioned 2009-12-21T03:53:20Z
dc.date.available 2009-12-21T03:53:20Z
dc.date.issued 2004 en_US
dc.identifier 2004001539 en_US
dc.identifier.citation Armstrong, N. et al. 2004 'Bayesian inference of nanoparticles-broadened X-ray line profiles', Journal of Research of the National Institute of Standards and Technology, vol. 109, no. 1, pp. 155-178. en_US
dc.identifier.issn 1044-677X en_US
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/5862
dc.description.abstract A single-step, self-contained method for determining the crystallite-size distribution and shape from experimental x-ray line profile data is presented. It is shown that the crystallite-size distribution can be determined without invoking a functional form for the size distribution, determining instead the size distribution with the least assumptions by applying the Bayesian/MaxEnt method. The Bayesian/MaxEnt method is tested using both simulated and experimental CeO2 data, the results comparing favourably with experimental CeO2 data from TEM measurements. en_US
dc.publisher US Government Printing Office en_US
dc.relation.isbasedon http://nvl.nist.gov/pub/nistpubs/jres/109/1/cnt109-1.htm en_US
dc.title Bayesian inference of nanoparticles-broadened X-ray line profiles en_US
dc.parent Journal of Research of the National Institute of Standards and Technology en_US
dc.journal.volume 109 en_US
dc.journal.number 1 en_US
dc.publocation Washington DC en_US
dc.identifier.startpage 155 en_US
dc.identifier.endpage 178 en_US
dc.cauo.name Science en_US


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