Lattice parameter measurement using Le Bail versus structural (Rietveld) refinement: A caution for complex, low symmetry systems

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dc.contributor.author Peterson, V. K en_US
dc.date.accessioned 2009-12-21T03:53:07Z
dc.date.available 2009-12-21T03:53:07Z
dc.date.issued 2005 en_US
dc.identifier 2005000873 en_US
dc.identifier.citation Peterson, V. 2005 'Lattice parameter measurement using Le Bail versus structural (Rietveld) refinement: A caution for complex, low symmetry systems', Powder Diffraction, vol. 20, no. 1, pp. 14-17. en_US
dc.identifier.issn 0885-7156 en_US
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/5858
dc.description.abstract The measurement of lattice parameters using the Le Bail method was shown to be inappropriate for a complex, low symmetry, structure, even with high resolution synchrotron diffraction data. The method failed as a result of ambiguous indexing in the absence of constraints on diffraction intensities, that arise when a structural model is used, combined with the large number of reflections. A caution for the use of the Le Bail and other whole-powder pattern decomposition methods is presented, particularly for high reflection density data. en_US
dc.publisher International Centre for Diffraction Data en_US
dc.relation.isbasedon http://dx.doi.org/10.1154/1.1810156 en_US
dc.subject Rietveld method. en
dc.subject X-ray powder diffraction. en
dc.title Lattice parameter measurement using Le Bail versus structural (Rietveld) refinement: A caution for complex, low symmetry systems en_US
dc.parent Powder Diffraction en_US
dc.journal.volume 20 en_US
dc.journal.number 1 en_US
dc.publocation Newtown Sq, USA en_US
dc.identifier.startpage 14 en_US
dc.identifier.endpage 17 en_US
dc.cauo.name Science en_US


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