Characterisation of materials through x-ray mapping

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Show simple item record Moran, Ken en_US Moran, L en_US Wuhrer, Ric en_US 2009-12-21T03:51:18Z 2009-12-21T03:51:18Z 2006 en_US
dc.identifier 2006005327 en_US
dc.identifier.citation Wuhrer Richard, Moran Ken, and Moran L 2006, 'Characterisation of materials through x-ray mapping', Intsitute of Materials Engineering Australiasia, vol. 30, pp. 63-70. en_US
dc.identifier.issn 1447-6738 en_US
dc.identifier.other C1 en_US
dc.description.abstract Scanning electron microscopy (SEM) energy dispersive spectroscopy (EDS, wavelength dispersive spectroscopy (WDS) and the conbination of these techniques through x-ray mapping (XRM) have become excellent tool for characterising the distribution of elements and phases in materials. Quantitative x-ray mapping (QXRM) enables reliable quantitative results that cna be an order of magnitude better than traditional analysis and is also far superior to regions of interest x-ray maps(ROIM) where low levels of an element overlaps are present. en_US
dc.publisher Intsitute of Materials Engineering Australiasia en_US
dc.title Characterisation of materials through x-ray mapping en_US
dc.parent Materials Forum en_US
dc.journal.volume 30 en_US
dc.journal.number en_US
dc.publocation North Melbourne, VIC Australia en_US
dc.identifier.startpage 63 en_US
dc.identifier.endpage 70 en_US INT en_US
dc.conference Verified OK en_US
dc.for 091200 en_US
dc.personcode 880536 en_US
dc.personcode 0000022654 en_US
dc.personcode 0000028637 en_US
dc.percentage 60 en_US Materials Engineering en_US
dc.classification.type FOR-08 en_US
dc.description.keywords x-ray mapping, pseudo colouring, quantitative analysis en_US

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