Multiresolution Analysis for Reconstruction of Conductivity Profiles in Eddy Current Non-Destructive Evaluation Using Probe Impedance Data

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dc.contributor.author Shao, Ke en_US
dc.contributor.author Guo, Youguang en_US
dc.contributor.author Lavers, J en_US
dc.date.accessioned 2009-12-21T03:51:02Z
dc.date.available 2009-12-21T03:51:02Z
dc.date.issued 2004 en_US
dc.identifier 2004001301 en_US
dc.identifier.citation Shao Ke, Guo Youguang, and Lavers J 2004, 'Multiresolution Analysis for Reconstruction of Conductivity Profiles in Eddy Current Non-Destructive Evaluation Using Probe Impedance Data', IEEE Magnetics Society, vol. 40, no. 4, pp. 2101-2103. en_US
dc.identifier.issn 0018-9464 en_US
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/5665
dc.publisher IEEE Magnetics Society en_US
dc.relation.hasversion Accepted manuscript version en_US
dc.relation.isbasedon http://dx.doi.org/10.1109/TMAG.2004.832264 en_US
dc.title Multiresolution Analysis for Reconstruction of Conductivity Profiles in Eddy Current Non-Destructive Evaluation Using Probe Impedance Data en_US
dc.parent IEEE Transactions on Magnetics en_US
dc.journal.volume 40 en_US
dc.journal.number 4 en_US
dc.publocation Piscataway, NY, USA en_US
dc.identifier.startpage 2101 en_US
dc.identifier.endpage 2103 en_US
dc.cauo.name FEIT.School of Elec, Mech and Mechatronic Systems en_US
dc.conference Verified OK en_US
dc.for 090600 en_US
dc.personcode 0000022706 en_US
dc.personcode 990817 en_US
dc.personcode 0000022707 en_US
dc.percentage 100 en_US
dc.classification.name Electrical and Electronic Engineering en_US
dc.classification.type FOR-08 en_US


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