| dc.contributor.author | Simon Peter | en_US |
| dc.contributor.author | Cibulkova Z | en_US |
| dc.contributor.author | Thomas Paul | en_US |
| dc.date.accessioned | 2009-06-26T04:10:51Z | |
| dc.date.available | 2009-06-26T04:10:51Z | |
| dc.date.issued | 2005 | en_US |
| dc.identifier | 2005000901 | en_US |
| dc.identifier.citation | Simon Peter, Cibulkova Z, and Thomas Paul 2005, 'Accelerated thermooxidative ageing tests and their extrapolation to lower temperatures', Springer, vol. 80, no. 2, pp. 381-385. | en_US |
| dc.identifier.issn | 1388-6150 | en_US |
| dc.identifier.other | C1 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10453/563 | |
| dc.description.abstract | A procedure for the extrapolation of accelerated thermo-oxidative ageing tests to lower temperatures is proposed. The procedure involves a deconvolution of the global process into high- and low-temperature components where the extrapolation to low temperatures is carried out using the low-temperature component. The method was tested on stabilized and unstabilized polyisoprene rubber and was found to produce realistic estimations of the length of the induction period of oxidation so giving a more accurate estimation of the service life. However, to obtain the low-temperature values of the adjustable kinetic parameters, very low heating rates are required (0.04 K min–1, 0.1 K min–1) making the measurement process time consuming. Using this method, more realistic estimates of the durability of a material are obtained. | en_US |
| dc.publisher | Springer | en_US |
| dc.relation.isbasedon | http://dx.doi.org/10.1007/s10973-005-0664-z | en_US |
| dc.title | Accelerated thermooxidative ageing tests and their extrapolation to lower temperatures | en_US |
| dc.parent | Journal Of Thermal Analysis And Calorimetry | en_US |
| dc.journal.volume | 80 | en_US |
| dc.journal.number | 2 | en_US |
| dc.publocation | Dordrecht, Netherlands | en_US |
| dc.identifier.startpage | 381 | en_US |
| dc.identifier.endpage | 385 | en_US |
| dc.cauo.name | Science | en_US |