Measuring patent assessment quality - analyzing the degree and kind of (in)consistency in patent offices' decision making

UTSePress Research/Manakin Repository

Search UTSePress Research


Advanced Search

Browse

My Account

Show simple item record

dc.contributor.author Burke, Paul en_US
dc.contributor.author Reitzig, Markus en_US
dc.date.accessioned 2009-12-21T02:38:35Z
dc.date.available 2009-12-21T02:38:35Z
dc.date.issued 2007 en_US
dc.identifier 2007000129 en_US
dc.identifier.citation Burke Paul and Reitzig Markus 2007, 'Measuring patent assessment quality - analyzing the degree and kind of (in)consistency in patent offices' decision making', Elsevier, vol. 36, no. 9, pp. 1404-1430. en_US
dc.identifier.issn 0048-7333 en_US
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/5478
dc.publisher Elsevier en_US
dc.relation.hasversion Accepted manuscript version en_US
dc.relation.isbasedon http://dx.doi.org/10.1016/j.respol.2007.06.003 en_US
dc.rights NOTICE: This is the author’s version of a work that was accepted for publication by Elsevier. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published by Elsevier. en_US
dc.title Measuring patent assessment quality - analyzing the degree and kind of (in)consistency in patent offices' decision making en_US
dc.parent Research Policy en_US
dc.journal.volume 36 en_US
dc.journal.number 9 en_US
dc.publocation United Kingdom en_US
dc.identifier.startpage 1404 en_US
dc.identifier.endpage 1430 en_US
dc.cauo.name BUS.School of Marketing en_US
dc.conference Verified OK en_US
dc.for 150310 en_US
dc.personcode 010838 en_US
dc.personcode 0000029744 en_US
dc.percentage 100 en_US
dc.classification.name Organisation and Management Theory en_US
dc.classification.type FOR-08 en_US
dc.edition November en_US
dc.description.keywords patent; patent office; patent quality; discrete choice models; variance decomposition en_US


Files in this item

This item appears in the following Collection(s)

Show simple item record