X-ray mapping and interpretation of scatter diagrams

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dc.contributor.author Moran, Ken en_US
dc.contributor.author Wuhrer, Ric en_US
dc.date.accessioned 2009-06-26T04:10:48Z
dc.date.available 2009-06-26T04:10:48Z
dc.date.issued 2006 en_US
dc.identifier 2006004104 en_US
dc.identifier.citation Moran Ken and Wuhrer Richard 2006, 'X-ray mapping and interpretation of scatter diagrams', Springer Wien, vol. 155, no. 1-2, pp. 209-217. en_US
dc.identifier.issn 0026-3672 en_US
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/520
dc.description.abstract Electron beam induced quantitative X-ray mapping has become a very useful characterisation tool for determining the elemental distribution in materials, whether using energy dispersive spectroscopy or wavelength dispersive spectroscopy. The X-ray intensi en_US
dc.publisher Springer Wien en_US
dc.relation.isbasedon http://dx.doi.org/10.1007/s00604-006-0545-6 en_US
dc.title X-ray mapping and interpretation of scatter diagrams en_US
dc.parent Microchimica Acta en_US
dc.journal.volume 155 en_US
dc.journal.number 1-2 en_US
dc.publocation Wien, Austria en_US
dc.identifier.startpage 209 en_US
dc.identifier.endpage 217 en_US
dc.cauo.name SCI.Physics and Advanced Materials en_US
dc.conference Verified OK en_US
dc.for 030100 en_US
dc.personcode 0000022654 en_US
dc.personcode 880536 en_US
dc.percentage 100 en_US
dc.classification.name Analytical Chemistry en_US
dc.classification.type FOR-08 en_US
dc.description.keywords correlation diagram; scatter diagrams; X-ray mapping; intensity histograms; EPMA en_US
dc.staffid 880536 en_US

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