X-ray diffraction analysis on crystallite development of nanostructured aluminium

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dc.contributor.author Meijer, Elisabeth en_US
dc.contributor.author Armstrong, Nicholas en_US
dc.contributor.author Yeung, Wing en_US
dc.date.accessioned 2009-06-26T04:10:35Z
dc.date.available 2009-06-26T04:10:35Z
dc.date.issued 2006 en_US
dc.identifier 2006004828 en_US
dc.identifier.citation Meijer Elisabeth, Armstrong Nicholas, and Yeung Wing 2006, 'X-ray diffraction analysis on crystallite development of nanostructured aluminium', SciTec Publications Ltd, vol. 118, no. 1, pp. 53-57. en_US
dc.identifier.issn 1012-0394 en_US
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/502
dc.description.abstract This study is to investigate the crystallite developemtn in nanostructured aluminium using x-ray line broadening analysis. Nanostructured aluminium was produced by equal channel angular extrusion at room temperature to a total deformation strain of ~17. Samples of the extruded metal were then heat treated at temperatures up to 300C. High order diffraction peaks were obtained using Mo radiation and the integral breadth was determined. It was found that as the annealing temperature increased, the integral breadth of the peak reflections decreased. By establishing the modified Williamson- Hall plots (integral breadth vs contract factor) after instrumental correction, it was detemined that the crystallite size of the metal was maintained ~80 nm at 100C. As the annealing temperature increased to 200C the crystallite size increased to ~118 nm. With increasing annealing temperature, the hardness of the metal decreased from ~60 HV to ~45 HV. en_US
dc.publisher SciTec Publications Ltd en_US
dc.title X-ray diffraction analysis on crystallite development of nanostructured aluminium en_US
dc.parent Solid State Phenomena en_US
dc.journal.volume 118 en_US
dc.journal.number en_US
dc.journal.number 1 en_US
dc.publocation Switzerland en_US
dc.identifier.startpage 53 en_US
dc.identifier.endpage 57 en_US
dc.cauo.name SCI.Faculty of Science en_US
dc.conference Verified OK en_US
dc.for 020400 en_US
dc.personcode 040573 en_US
dc.personcode 921034 en_US
dc.personcode 910582 en_US
dc.percentage 100 en_US
dc.classification.name Condensed Matter Physics en_US
dc.classification.type FOR-08 en_US
dc.staffid 910582 en_US

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