Observation of blue shifts in ZnO/ZnMgO multiple quantum well structures by ion-implantation induced intermixing

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dc.contributor.author Coleman V en_US
dc.contributor.author Buda M en_US
dc.contributor.author Tan Hark en_US
dc.contributor.author Jagadish Chennupati en_US
dc.contributor.author Phillips Matthew en_US
dc.contributor.author Koike K en_US
dc.contributor.author Sasa S en_US
dc.contributor.author Inoue M en_US
dc.contributor.author Yano M en_US
dc.date.accessioned 2009-06-26T04:10:34Z
dc.date.available 2009-06-26T04:10:34Z
dc.date.issued 2006 en_US
dc.identifier 2006003959 en_US
dc.identifier.citation Coleman V et al. 2006, 'Observation of blue shifts in ZnOZnMgO multiple quantum well structures by ion-implantation induced intermixing', IOP Publishing Ltd, vol. 21, no. 3, pp. 25-28. en_US
dc.identifier.issn 0268-1242 en_US
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/485
dc.description.abstract Implantation with low-energy (80 keV) oxygen ions and subsequent rapid thermal annealing at 800 ◦C are used to induce intermixing in a stack of 19 ZnO/Zn0.7Mg0.3O multiple quantum wells grown on sapphire by molecular beam epitaxy. Large blue shifts of more than 300 meV have been observed for doses up to 1 × 1016 cm−2, with no observation of saturation. This process is driven by the creation of defects by implantation which encourage the diffusion of Mg from the barrier layers into the ZnO quantum wells. Although defects are introduced during the implantation process, good recovery of the cathodoluminescence is seen following rapid thermal annealing. The Zn–Mg interdiffusion in this system has also been calculated for the corresponding ion doses, and the diffusion coefficient extracted. This study has significant implications for band gap engineering of ZnO/ZnMgO optoelectronic devices. en_US
dc.publisher Institute of Physics Publishing en_US
dc.relation.isbasedon http://dx.doi.org/10.1088/0268-1242/21/3/L02 en_US
dc.title Observation of blue shifts in ZnO/ZnMgO multiple quantum well structures by ion-implantation induced intermixing en_US
dc.parent Semiconductor Science And Technology en_US
dc.journal.volume 21 en_US
dc.journal.number 3 en_US
dc.publocation Bristol, UK en_US
dc.identifier.startpage 25 en_US
dc.identifier.endpage 28 en_US
dc.cauo.name Physics and Advanced Materials en_US


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