Quantification of Arsenic in activated carbon using particle induced X-ray emission

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dc.contributor.author Yadav, N en_US
dc.contributor.author Maheswaran, S en_US
dc.contributor.author Shutthanandan, Vaithiyalingam en_US
dc.contributor.author Thevuthasan, Suntharampillai en_US
dc.contributor.author Vigneswaran, Saravanamuth en_US
dc.contributor.author Ngo, Huu Hao en_US
dc.date.accessioned 2009-06-26T04:10:30Z
dc.date.available 2009-06-26T04:10:30Z
dc.date.issued 2006 en_US
dc.identifier 2006005561 en_US
dc.identifier.citation Yadav N et al. 2006, 'Quantification of Arsenic in activated carbon using particle induced X-ray emission', Elsevier Science B.V., vol. 251, no. 1, pp. 191-196. en_US
dc.identifier.issn 0168-583X en_US
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/422
dc.description.abstract To date, the trace elemental analysis of solids with inhomogencous internal structure has been limited, particularly in the case of adsorbents. High-energy ion beam based particle induced X-ray emission (PIXE) is an ideal analytical too] suitable for sim en_US
dc.publisher Elsevier Science B.V. en_US
dc.relation.isbasedon http://dx.doi.org/10.1016/j.nimb.2006.05.016 en_US
dc.title Quantification of Arsenic in activated carbon using particle induced X-ray emission en_US
dc.parent Nuclear Instruments and Methods in Physics Research B en_US
dc.journal.volume 251 en_US
dc.journal.number 1 en_US
dc.publocation Amsterdam, The Netherlands en_US
dc.identifier.startpage 191 en_US
dc.identifier.endpage 196 en_US
dc.cauo.name FEIT.School of Civil and Environmental Engineering en_US
dc.conference Verified OK en_US
dc.for 040200 en_US
dc.personcode 0000020903 en_US
dc.personcode 0000020902 en_US
dc.personcode 0000021184 en_US
dc.personcode 0000020905 en_US
dc.personcode 890265 en_US
dc.personcode 900451 en_US
dc.percentage 100 en_US
dc.classification.name Geochemistry en_US
dc.classification.type FOR-08 en_US
dc.description.keywords PIXE; Activated carbon; NAA; AAS; Pelletization en_US
dc.staffid 900451 en_US


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