Abstract:
PACS 61.72.Ss, 61.72.Vv, 68.37.Ps, 68.55.Ln, 78.60.Hk, 78.67.De
Effects of n-type doping of GaN epilayers and InGaN/GaN quantum well structures are studied. We evaluate
the influence of n-type doping on a structural quality of the samples (using atomic force and scanning electron
microscopy), on light emission intensity and on in-plane emission intensity variations. Possible mechanisms
responsible for strong enhancement of light emission from doped samples are discussed.