Imaging Point Defects Using a Transmission Electron Microscope with Controllable Spherical Aberration

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dc.contributor.author Anstis, Geoff en_US
dc.date.accessioned 2009-12-21T02:28:51Z
dc.date.available 2009-12-21T02:28:51Z
dc.date.issued 2001 en_US
dc.identifier 2004004467 en_US
dc.identifier.citation Anstis Geoffrey 2001, 'Imaging Point Defects Using a Transmission Electron Microscope with Controllable Spherical Aberration', Taylor & Francis Ltd, vol. 81, no. 11, pp. 1687-1699. en_US
dc.identifier.issn 1364-2812 en_US
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/3561
dc.publisher Taylor & Francis Ltd en_US
dc.relation.isbasedon http://dx.doi.org/10.1080/13642810110079934 en_US
dc.title Imaging Point Defects Using a Transmission Electron Microscope with Controllable Spherical Aberration en_US
dc.parent Philosophical Magazine B en_US
dc.journal.volume 81 en_US
dc.journal.number 11 en_US
dc.publocation London, UK en_US
dc.identifier.startpage 1687 en_US
dc.identifier.endpage 1699 en_US
dc.cauo.name SCI.Physics and Advanced Materials en_US
dc.conference Verified OK en_US
dc.for 020500 en_US
dc.personcode 840027 en_US
dc.percentage 40 en_US
dc.classification.name Optical Physics en_US
dc.classification.type FOR-08 en_US
dc.staffid 840027 en_US


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