Bloch mode scattering matrix methods for modelling extended photonic crystal structures. II: Applications

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dc.contributor.author White, Tom en_US
dc.contributor.author Botten, Lindsay en_US
dc.contributor.author De Sterke, C en_US
dc.contributor.author Mcphedran, Ross en_US
dc.contributor.author Asatryan, Ara en_US
dc.contributor.author Langtry, Tim en_US
dc.date.accessioned 2009-06-26T04:10:25Z
dc.date.available 2009-06-26T04:10:25Z
dc.date.issued 2004 en_US
dc.identifier 2004001974 en_US
dc.identifier.citation White Tom et al. 2004, 'Bloch mode scattering matrix methods for modelling extended photonic crystal structures. II: Applications', American Physical Society, vol. 70, no. 5, pp. 1-10. en_US
dc.identifier.issn 1539-3755 en_US
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/352
dc.description.abstract The Bloch mode scattering matrix method is applied to several photonic crystal waveguide structures and devices, including waveguide dislocations, a Fabry-Perot resonator, a folded directional coupler, and a Y-junction design. The method is an efficient tool for calcuating the properties of extended photonic crystal (PC) devices, in particular whenthe device consists of a small number of distict photonic crystal structures, or for long propagation lengths through uniform PC waveguides. The physical insight provided by the method i sused to derive simple, semianalytic models that allow fast and efficient calculations of complex photonic crystal structures. We discuss the situations in which such simplifications can be made and provide examples. en_US
dc.publisher American Physical Society en_US
dc.relation.isbasedon http://dx.doi.org/10.1103/PhysRevE.70.056607 en_US
dc.title Bloch mode scattering matrix methods for modelling extended photonic crystal structures. II: Applications en_US
dc.parent Physical Review E en_US
dc.journal.volume 70 en_US
dc.journal.number 5 en_US
dc.publocation USA en_US
dc.identifier.startpage 1 en_US
dc.identifier.endpage 10 en_US
dc.cauo.name SCI.Mathematical Sciences en_US
dc.conference Verified OK en_US
dc.for 020500 en_US
dc.personcode 0000020322 en_US
dc.personcode 780055 en_US
dc.personcode 0000018208 en_US
dc.personcode 100021 en_US
dc.personcode 010655 en_US
dc.personcode 830105 en_US
dc.percentage 100 en_US
dc.classification.name Optical Physics en_US
dc.classification.type FOR-08 en_US
dc.staffid 830105 en_US


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