Electron Beam Current Loss at the High Vacuum High Pressure Boundary in the Environmental Scanning Electron Microscope

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dc.contributor.author Danilatos, Gerasimos en_US
dc.contributor.author Nailon, John en_US
dc.contributor.author Phillips, Matt en_US
dc.date.accessioned 2009-11-12T05:29:02Z
dc.date.available 2009-11-12T05:29:02Z
dc.date.issued 2001 en_US
dc.identifier 2004004439 en_US
dc.identifier.citation Danilatos Gerasimos, Phillips Matthew, and Nailon John 2001, 'Electron Beam Current Loss at the High Vacuum High Pressure Boundary in the Environmental Scanning Electron Microscope', Cambridge University Press., vol. 7, no. 5, pp. 397-406. en_US
dc.identifier.issn 1431-9276 en_US
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/3276
dc.publisher Cambridge University Press. en_US
dc.relation.isbasedon http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=95891&fulltextType=RA&fileId=S143192760101039X
dc.subject Scanning electron microscopes. en
dc.subject Electron microscopes. en
dc.subject Electron beams. en
dc.title Electron Beam Current Loss at the High Vacuum High Pressure Boundary in the Environmental Scanning Electron Microscope en_US
dc.parent Microscopy & Microanalysis en_US
dc.journal.volume 7 en_US
dc.journal.number 5 en_US
dc.publocation New York, USA en_US
dc.identifier.startpage 397 en_US
dc.identifier.endpage 406 en_US
dc.cauo.name SCI.Physics and Advanced Materials en_US
dc.conference Verified OK en_US
dc.for 020400 en_US
dc.personcode 0000024177 en_US
dc.personcode 810070 en_US
dc.personcode 0000024178 en_US
dc.percentage 80 en_US
dc.classification.name Condensed Matter Physics en_US
dc.classification.type FOR-08 en_US


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