Imaging Deep Trap Distributions By Low Vacuum Scanning Electron Microscopy

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dc.contributor.author Toth, Milos en_US
dc.contributor.author Knowles, William en_US
dc.contributor.author Phillips, Matt en_US
dc.date.accessioned 2009-11-12T04:40:55Z
dc.date.available 2009-11-12T04:40:55Z
dc.date.issued 2007 en_US
dc.identifier 2006015321 en_US
dc.identifier.citation Toth Milos, Knowles William, and Phillips Matthew 2007, 'Imaging Deep Trap Distributions By Low Vacuum Scanning Electron Microscopy', Amer Inst Physics, vol. 90, no. 7, pp. 0-0. en_US
dc.identifier.issn 0003-6951 en_US
dc.identifier.other C1 en_US
dc.identifier.uri http://hdl.handle.net/10453/3206
dc.description.abstract The distribution of deep traps in a bulk dielectric (Al2O3) is imaged by low vacuum scanning electron microscopy (LVSEM). The image contrast corresponds to spatial variations in radiation-induced, field-enhanced conductivity. A methodology is presented f en_US
dc.publisher Amer Inst Physics en_US
dc.title Imaging Deep Trap Distributions By Low Vacuum Scanning Electron Microscopy en_US
dc.parent Applied Physics Letters en_US
dc.journal.volume 90 en_US
dc.journal.number 7 en_US
dc.publocation Melville en_US
dc.identifier.startpage 0 en_US
dc.identifier.endpage 0 en_US
dc.cauo.name SCI.Physics and Advanced Materials en_US
dc.conference Verified OK en_US
dc.for 020400 en_US
dc.personcode 112289 en_US
dc.personcode 0000022102 en_US
dc.personcode 810070 en_US
dc.percentage 100 en_US
dc.classification.name Condensed Matter Physics en_US
dc.classification.type FOR-08 en_US
dc.location.activity ISI:000244249800052 en_US
dc.description.keywords Phonon Emission; Insulators; Semiconductors; Ionization; Sio2; Cathodoluminescence; Irradiation; Scattering; Transport; Energies en_US
dc.staffid 810070 en_US


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