An Analysis of the bias correction problem in simultaneous localization and mapping

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dc.contributor.author Wijesoma, W en_US
dc.contributor.author Perera, Lochana en_US
dc.contributor.author Adams, Martin en_US
dc.contributor.author Challa, Subhash en_US
dc.contributor.editor N/A en_US
dc.date.accessioned 2009-11-09T05:36:57Z
dc.date.available 2009-11-09T05:36:57Z
dc.date.issued 2005 en_US
dc.identifier 2005003518 en_US
dc.identifier.citation Wijesoma W et al. 2005, 'An Analysis of the bias correction problem in simultaneous localization and mapping', IEEE, USA, pp. 747-752. en_US
dc.identifier.issn 0-7803-8912-3 en_US
dc.identifier.other E1 en_US
dc.identifier.uri http://hdl.handle.net/10453/2882
dc.description.abstract Unmodeled systematic and nonsystematic errors in robot kinematics and measurement processes often cause adverse effects in several autonomous navigation tasks. In particular, accumulated sensor biases can render simultaneous localization and mapping (SLAM) algorithms of autonomous vehicles to perform very poorly especially in large unexplored terrains including cycles, as a result of the estimator divergence and inconsistency. One way to deal with this problem is the accurate modeling and precise calibration of sensors. However this may add up to longer setup and calibration times. Even after accurate calibration and modeling, sensor calibration may often subject to drifts, rendering the efforts ineffective. Therefore, the correct and effective way to deal with this problem is explicit estimation of these parameters with other states. In this work we address the estimation theoretic sensor bias correction problem in SLAM using a simple unified framework and establish theoretically, the behavior and properties of the solution with special consideration to diminishing uncertainty, rates of convergence and observability en_US
dc.publisher IEEE en_US
dc.relation.isbasedon http://dx.doi.org/10.1109/IROS.2005.1544952 en_US
dc.title An Analysis of the bias correction problem in simultaneous localization and mapping en_US
dc.parent Proceedings of IEEE/RSJ International Conference on Intelligent Robots and Systems, 2005 (IROS 2005) en_US
dc.journal.volume en_US
dc.journal.number en_US
dc.publocation USA en_US
dc.identifier.startpage 747 en_US
dc.identifier.endpage 752 en_US
dc.cauo.name FEIT.School of Elec, Mech and Mechatronic Systems en_US
dc.conference Verified OK en_US
dc.conference.location Piscataway, USA en_US
dc.for 091000 en_US
dc.personcode 0000026361 en_US
dc.personcode 0000026362 en_US
dc.personcode 0000026363 en_US
dc.personcode 040218 en_US
dc.percentage 50 en_US
dc.classification.name Manufacturing Engineering en_US
dc.classification.type FOR-08 en_US
dc.custom IEEE/RSJ International Conference on Intelligent Robots and Systems en_US
dc.date.activity 20050802 en_US
dc.location.activity Piscataway, USA en_US
dc.description.keywords convergence; localization; mapping en_US
dc.staffid 040218 en_US


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