Browsing 10 Technology by Author "Remond Guy"

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Browsing 10 Technology by Author "Remond Guy"

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  • Fialin Michel; Remond Guy; Nockolds Clive; Myklebust Robert; Phillips Matthew; Roques-Carmes Claude (US Government Printing Office, 2002)
    Line shapes of atomic lines and soft x-ray emission bands measured with a wavelength dispersive spectrometer (WDS) with the Electron Probe Micro Analyzer (EPMA) are reviewed. Least square fitting to pseudo-Voigt ...
  • Nockolds Clive; Phillips Matthew; Remond Guy; Roques-Carmes Claude (US Government Printing Office, 2002)
    Specimen preparation using abrasives results in surface and subsurface mechanical (stresses, strains), geometrical (roughness), chemical (contaminants, reaction products) and physical modifications (structure, texture, ...