ESEM beam current measuring device based on a planar shotty diode

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dc.contributor.author Aubin, Andre-Sebastien en_US
dc.contributor.author Drouin, Dominique en_US
dc.contributor.author Phillips, Matt en_US
dc.contributor.editor Voelkl E; Piston D; Gauvin R; Lockley AJ; Bailey GW; Mickernan S en_US
dc.date.accessioned 2009-11-09T05:34:18Z
dc.date.available 2009-11-09T05:34:18Z
dc.date.issued 2002 en_US
dc.identifier 2004003537 en_US
dc.identifier.citation Aubin André-Sébastien, Drouin Dominique, and Phillips Matthew 2002, 'ESEM beam current measuring device based on a planar shotty diode', Cambridge University Press, New York, USA, pp. 1538CD-1539CD. en_US
dc.identifier.issn 1341-9276 en_US
dc.identifier.other E1 en_US
dc.identifier.uri http://hdl.handle.net/10453/2331
dc.publisher Cambridge University Press en_US
dc.relation.isbasedon en_US
dc.relation.isbasedon NA en_US
dc.title ESEM beam current measuring device based on a planar shotty diode en_US
dc.parent Proceedings of Microscopy and microanalysis 2002, Vol 11 (Suppl 2) en_US
dc.journal.volume en_US
dc.journal.number en_US
dc.publocation New York, USA en_US
dc.identifier.startpage 1538CD en_US
dc.identifier.endpage 1539CD en_US
dc.cauo.name SCI.Faculty of Science en_US
dc.conference Verified OK en_US
dc.conference.location Canada en_US
dc.for 020400 en_US
dc.personcode 0000023397 en_US
dc.personcode 0000021798 en_US
dc.personcode 810070 en_US
dc.percentage 80 en_US
dc.classification.name Condensed Matter Physics en_US
dc.classification.type FOR-08 en_US
dc.custom Microscopy & Microanalysis en_US
dc.date.activity 20020804 en_US
dc.location.activity Canada en_US
dc.staffid 810070 en_US


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