X-ray microanalysis of insulators in a variable pressure environment
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| dc.contributor.author | Toth Milos | en_US |
| dc.contributor.author | Craven J | en_US |
| dc.contributor.author | Phillips Matthew | en_US |
| dc.contributor.author | Thiel Bradley | en_US |
| dc.contributor.author | Donald Athene | en_US |
| dc.contributor.editor | Voelkl E; Piston D; Gauvin R; Lockley AJ; Bailey GW; Mickernan S | en_US |
| dc.date.accessioned | 2009-11-09T05:34:16Z | |
| dc.date.available | 2009-11-09T05:34:16Z | |
| dc.date.issued | 2002 | en_US |
| dc.identifier | 2004003568 | en_US |
| dc.identifier.citation | Toth Milos et al. 2002, 'X-ray microanalysis of insulators in a variable pressure environment', Cambridge University Press, New York, USA, pp. 1478-1479. | en_US |
| dc.identifier.issn | 1341-9276 | en_US |
| dc.identifier.other | E1 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10453/2323 | |
| dc.publisher | Cambridge University Press | en_US |
| dc.relation.isbasedon | en_US | |
| dc.title | X-ray microanalysis of insulators in a variable pressure environment | en_US |
| dc.parent | Proceedings of Microscopy and microanalysis 2002 | en_US |
| dc.journal.volume | en_US | |
| dc.journal.number | en_US | |
| dc.publocation | New York, USA | en_US |
| dc.identifier.startpage | 1478 | en_US |
| dc.identifier.endpage | 1479 | en_US |
| dc.cauo.name | Science | en_US |
| dc.conference | Microscopy & Microanalysis | en_US |
| dc.conference.location | Quebec, Canada | en_US |
