X-ray microanalysis of insulators in a variable pressure environment

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dc.contributor.author Toth, Milos en_US
dc.contributor.author Craven, J en_US
dc.contributor.author Thiel, Bradley en_US
dc.contributor.author Donald, Athene en_US
dc.contributor.author Phillips, Matt en_US
dc.contributor.editor Voelkl E; Piston D; Gauvin R; Lockley AJ; Bailey GW; Mickernan S en_US
dc.date.accessioned 2009-11-09T05:34:16Z
dc.date.available 2009-11-09T05:34:16Z
dc.date.issued 2002 en_US
dc.identifier 2004003568 en_US
dc.identifier.citation Toth Milos et al. 2002, 'X-ray microanalysis of insulators in a variable pressure environment', Cambridge University Press, New York, USA, pp. 1478-1479. en_US
dc.identifier.issn 1341-9276 en_US
dc.identifier.other E1 en_US
dc.identifier.uri http://hdl.handle.net/10453/2323
dc.publisher Cambridge University Press en_US
dc.relation.isbasedon en_US
dc.relation.isbasedon NA en_US
dc.title X-ray microanalysis of insulators in a variable pressure environment en_US
dc.parent Proceedings of Microscopy and Microanalysis 2002, Vol 11 (suppl 2) en_US
dc.journal.volume en_US
dc.journal.number en_US
dc.publocation New York, USA en_US
dc.identifier.startpage 1478 en_US
dc.identifier.endpage 1479 en_US
dc.cauo.name SCI.Faculty of Science en_US
dc.conference Verified OK en_US
dc.conference.location Quebec, Canada en_US
dc.for 020400 en_US
dc.personcode 112289 en_US
dc.personcode 0000023419 en_US
dc.personcode 810070 en_US
dc.personcode 0000023420 en_US
dc.personcode 0000023421 en_US
dc.percentage 80 en_US
dc.classification.name Condensed Matter Physics en_US
dc.classification.type FOR-08 en_US
dc.custom Microscopy & Microanalysis en_US
dc.date.activity 20020805 en_US
dc.location.activity Quebec, Canada en_US

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