Risk assessment of strategies using total time on test transform

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dc.contributor.author Zhao N en_US
dc.contributor.author Lu Hai Yan en_US
dc.contributor.author Song Yonghua en_US
dc.contributor.editor N/A en_US
dc.date.accessioned 2009-11-09T05:34:02Z
dc.date.available 2009-11-09T05:34:02Z
dc.date.issued 2006 en_US
dc.identifier 2006005308 en_US
dc.identifier.citation Zhao N, Lu Hai Yan, and Song Yonghua 2006, 'Risk assessment of strategies using total time on test transformation', IEEE Power engineering society, Montreal, Quebec, Canada, pp. 1-8. en_US
dc.identifier.issn 1-4244-0493-2 en_US
dc.identifier.other E1 en_US
dc.identifier.uri http://hdl.handle.net/10453/2305
dc.description.abstract This paper proposes a new approach to risk assessment of strategies based on the Total Time on Test (TTT) transform techniques. A new concept of risk of loss is introduced, whose value is determined by potential losses and corresponding probabilities of all unfavourable cases. It is closely related to the maximum acceptable (cost) value (MAV) set by a decision maker. How to calculate the value of risk of loss for a given strategy and a MAVis described in depth and a final formula is derived. The values of risk of loss of different strategies can be used for comparisons of these strategies in terms of overall potential losses for the purpose of assisting decision makers in choosing a better strategy. The results of this method can provide specific infonnation about the risk of loss of a strategy. Two examples are used to demonstrate the usage of this method. The scaled TTI plot method and this risk of loss method are applied to the example A and the results of both methods agree with each other. In the example B to which the scaled TTT method is not applicable, the risk of loss method can provide reasonable solutions. This new method can be used for other situations in which the TIT concepts are valid. en_US
dc.publisher The Institute of Electrical and Electronic Engineers Inc (IEEE) en_US
dc.relation.isbasedon http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=1709062&isnumber=36065 en_US
dc.title Risk assessment of strategies using total time on test transform en_US
dc.parent Proceedings of IEEE power engineering society general meeting 2006 en_US
dc.journal.volume en_US
dc.journal.number en_US
dc.publocation Montreal, Quebec, Canada en_US
dc.identifier.startpage en_US
dc.identifier.endpage en_US
dc.cauo.name Software Engineering en_US
dc.conference IEEE Power engineering society en_US
dc.conference.location Montreal, Quebec, Canada en_US


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