Validity of First-Order knowledge bases

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dc.contributor.author Debenham John en_US
dc.contributor.editor Russell I, Kolen J en_US
dc.date.accessioned 2009-11-09T02:45:53Z
dc.date.available 2009-11-09T02:45:53Z
dc.date.issued 2001 en_US
dc.identifier 2005001084 en_US
dc.identifier.citation Debenham John 2001, 'Validity of First-Order knowledge bases', AAAI, Menlo Park, pp. 217-221. en_US
dc.identifier.issn 0-1-57735-133-9 en_US
dc.identifier.other E1 en_US
dc.identifier.uri http://hdl.handle.net/10453/1980
dc.description.abstract A knowledge base is maintained by modifying its conceptual model and by using those modifications to specify changes to its implementation. The maintenance problem is to determine which parts of that model should be checked for correctness in response a change in the application. The maintenance problem is not computable for first-order knowledge bases. Two things in the conceptual model are joined by a maintenance link if a modification to one of them means that the other must be checked for correctness, and so possibly modified, if consistency of the model is to be preserved. In a unified conceptual model for first-order knowledge bases the data and knowledge are modelled formally in a uniform way, A characterisation is given of four different kinds of maintenance links in a unified conceptual model. Two of these four kinds of maintenance links can be removed by transforming the conceptual model. In this way the maintenance problem is simplified. en_US
dc.publisher Association for the Advancement of Artificial Intelligence en_US
dc.relation.isbasedon http://www.aaai.org/Press/Proceedings/flairs01.php en_US
dc.title Validity of First-Order knowledge bases en_US
dc.parent Proceedings of 14th International FLAIRS Conference en_US
dc.journal.volume en_US
dc.journal.number en_US
dc.publocation Menlo Park en_US
dc.identifier.startpage 217 en_US
dc.identifier.endpage 221 en_US
dc.cauo.name Software Engineering en_US
dc.conference 14th International Florida Artificial Intelligence Research Society Conference en_US
dc.conference.location Key West en_US


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