Browsing Conference Papers by Author "Delample, Vincent"

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Browsing Conference Papers by Author "Delample, Vincent"

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  • Drouin, Dominique; Pauc, N; Phillips, Matthew; Poissant, Patrick; Delample, Vincent; Souifi, Albert (IEEE, 2006)
    The scanning electron microsope (SEM) cna be used to study and characterise a wide variety of materials used in nanoelectronic and photonic applications. Several different techniques make use of this versatile tool. These ...