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  • Ton-That, Cuong; Shard, Alex; Teare, D.; Bradley, R. (Elsevier Ltd, 2001)
    Films of polystyrene (PS) and poly(methyl methacrylate) (PMMA) blends of two different thicknesses have been examined by X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM). Blends with different ...
  • Meijer, Elisabeth; Armstrong, Nicholas; Yeung, Wing (SciTec Publications Ltd, 2006)
    This study is to investigate the crystallite developemtn in nanostructured aluminium using x-ray line broadening analysis. Nanostructured aluminium was produced by equal channel angular extrusion at room temperature to a ...
  • Moran, Ken; Wuhrer, Ric; Phillips, Matt (Cambridge university Press, 2006)
    Characterisation of materials frequently involves the determination of variation in composition, structure and microstructure, by the use of a variety of imaging and analysis techniques. There is an increasing need to ...
  • White, Richard; Thomas, Paul; Moran, Ken; Phillips, Matt; Wuhrer, Ric (Cambridge Univ Press, 2010)
    The discoloring interaction between the artist's pigments cadmium yellow and the copper-containing malachite, an interaction that is conjectured to cause black spotting in oil paintings of the 19th and early 20th centuries, ...
  • Moran, Ken; Davey, P; Wuhrer, Ric; Phillips, Matt (Cambridge University Press, 2006)
    X-ray mapping (XRM) is an extremely useful problem solving tool. However, the two major problems for energy dispersive spectroscopy are interpretation of results under non ideal conditions (strong overlap and small peak ...
  • Solina, Danica; Cheary, Robert; Kalceff, Walter; Mccredie, Geoff (Elsevier Science Sa, 2005)
    An X-ray reflectivity study carried out on 45-450 angstrom films of radio frequency sputtered silicon oxide on silicon, with particular attention given to the interface between film and substrate. In order to model refectivity ...
  • Kucheyev, Sergei; Toth, Milos; Williams, Jim; Jagadish, Chennupati; Li, Gang; Phillips, Matt (American Institute of Physics, 2002)
    Electrical isolation of n-type GaN epilayers bombarded with MeV light ions is studied by energy dispersive x-ray spectrometry (EDS). We show that the maximum bremsstrahlung x-ray energy (the Duane-Hunt limit) can be used ...
  • Yan, M; Shao, Ke; Hu, Xw; Guo, Youguang; Zhu, Jianguo; Lavers, J (IEEE-inst Electrical Electronics Engineers Inc, 2007)
    In this paper, a novel and normalized Z-transform-based finite-difference time-domain (ZTFDTD) method is presented for simulating the interaction of the electromagnetic (EM) wave with unmagnetized plasma. The 2-D ZTFDTD ...