Analysis of admixed CeO2 nanoparticles via TEM and x-ray diffraction techniques

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dc.contributor.author Vella, A en_US
dc.contributor.author Whitley, Rhys en_US
dc.contributor.author Armstrong, Nicholas en_US
dc.contributor.author Dowd, Annette en_US
dc.contributor.author Cline, James en_US
dc.contributor.editor Avdeev M en_US
dc.date.accessioned 2009-11-09T02:44:02Z
dc.date.available 2009-11-09T02:44:02Z
dc.date.issued 2006 en_US
dc.identifier 2006005346 en_US
dc.identifier.citation Vella A et al. 2006, 'Analysis of admixed CeO2 nanoparticles via TEM and x-ray diffraction techniques', AIP, Australia, pp. 1-4. en_US
dc.identifier.issn 1-920791-09-4 en_US
dc.identifier.other E1 en_US
dc.identifier.uri http://hdl.handle.net/10453/1703
dc.description.abstract The techniques used to identify nanoparticle size and shape characteristics are o vital importance in the developemnt of functional nanoparticles. Each technique offers different advantages: this work compares the two techniques of transmission electron microscopy (TEM) and x-ray diffraction (XRD) analysis by charactering CeO2 nanoparticle specimens. Whole Powder Pattern Modelling (WPPM) is used to quantify the specimens dislocations and size characteristics from XRD data. Using admixed samples we test and extend the techniques. We show that XRD accurately characterises small crystallite distributions and that larger crystallite distributions necessitate further investigation. en_US
dc.publisher AIP en_US
dc.relation.isbasedon http://www.aip.org.au/wagga2006/ en_US
dc.title Analysis of admixed CeO2 nanoparticles via TEM and x-ray diffraction techniques en_US
dc.parent 30th Annual Condensed matter and materials meeting en_US
dc.journal.volume en_US
dc.journal.number en_US
dc.publocation Australia en_US
dc.identifier.startpage 1 en_US
dc.identifier.endpage en_US
dc.identifier.endpage 4 en_US
dc.cauo.name SCI.Faculty of Science en_US
dc.conference Verified OK en_US
dc.conference.location Wagga Wagga en_US
dc.for 020500 en_US
dc.personcode 0000020663 en_US
dc.personcode 996928 en_US
dc.personcode 921034 en_US
dc.personcode 030626 en_US
dc.personcode 0000021075 en_US
dc.percentage 50 en_US
dc.classification.name Optical Physics en_US
dc.classification.type FOR-08 en_US
dc.custom Annual Condensed matter and materials meeting en_US
dc.date.activity 20060207 en_US
dc.location.activity Wagga Wagga en_US


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