Abstract:
The techniques used to identify nanoparticle size and shape characteristics are
of vital importance in the development of functional nanoparticles. Each
technique offers different advantages; this work compares the two techniques
of transmission electron microscopy (TEM) and X-ray diffraction (XRD)
analysis by characterising CeO2 nanoparticle specimens. Whole Powder
Pattern Modelling (WPPM) is used to quantify the specimen dislocations and
size characteristics from XRD data. Using admixed samples we test and
extend the techniques. We show that XRD accurately characterises small
crystallite distributions and that larger crystallite distributions necessitate
further investigation.
