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  • Ton-That, Cuong; Shard, Alex; Teare, D.; Bradley, R. (Elsevier Ltd, 2001)
    Films of polystyrene (PS) and poly(methyl methacrylate) (PMMA) blends of two different thicknesses have been examined by X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM). Blends with different ...
  • Meijer, Elisabeth; Armstrong, Nicholas; Yeung, Wing (SciTec Publications Ltd, 2006)
    This study is to investigate the crystallite developemtn in nanostructured aluminium using x-ray line broadening analysis. Nanostructured aluminium was produced by equal channel angular extrusion at room temperature to a ...
  • Solina, Danica; Cheary, Robert; Kalceff, Walter; Mccredie, Geoff (Elsevier Science Sa, 2005)
    An X-ray reflectivity study carried out on 45-450 angstrom films of radio frequency sputtered silicon oxide on silicon, with particular attention given to the interface between film and substrate. In order to model refectivity ...
  • Kucheyev, Sergei; Toth, Milos; Williams, Jim; Jagadish, Chennupati; Li, Gang; Phillips, Matt (American Institute of Physics, 2002)
    Electrical isolation of n-type GaN epilayers bombarded with MeV light ions is studied by energy dispersive x-ray spectrometry (EDS). We show that the maximum bremsstrahlung x-ray energy (the Duane-Hunt limit) can be used ...