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  • Schmidt, M; Prill Sempere, L; Tyagi, H; Poulton, Christopher; Russell, P (American Physical Society, 2008)
    We report the fabrication of triangular lattices of parallel gold and silver nanowires of high optical quality, with diameters down to 500 nm and length-to-diameter ratios as high as 100,000. The nanowires are supported ...
  • Caprarelli, Graziella; Wang, Bu (Blackwell Publishing Ltd, 2012)
    In this paper we report the results of our investigation of Evros Vallis, a martian late Noachian dendritic valley network centered at similar to 12 degrees E, 12 degrees S. The study area is located SSW of Schiaparelli ...
  • Sharma, Manjula; Pollard, Judith; Mendez, Alberto; Mills, David; O'Byrne, John; Scott, Dale; Hagon, Sue; Gribble, Joan; Kirkup, Leslie; Livett, Michelle; Low, David; Merchant, Alex; Rayner, Anton; Swan, Geoff; Zadnik, Marjan; Zealey, William (Institute of Physics Publishing, 2008)
    In a study to assess how effectively undergraduate physics studies have prepared students for the workplace, we attempted to locate and interview traditional 3-year or 4-year physics students who had graduated in the past ...
  • Botten, Lindsay; White, Tom; De Sterke, C; Mcphedran, Ross (American Physical Soc, 2006)
    We describe the surprising phenomenon of near-perfect coupling from free space into uniform two-dimensional rod-type photonic crystals over a wide range of incident angles. This behavior is shown to be a generic feature ...
  • Ton-That, Cuong; Shard, Alex; Teare, D.; Bradley, R. (Elsevier Ltd, 2001)
    Films of polystyrene (PS) and poly(methyl methacrylate) (PMMA) blends of two different thicknesses have been examined by X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM). Blends with different ...
  • Meijer, Elisabeth; Armstrong, Nicholas; Yeung, Wing (SciTec Publications Ltd, 2006)
    This study is to investigate the crystallite developemtn in nanostructured aluminium using x-ray line broadening analysis. Nanostructured aluminium was produced by equal channel angular extrusion at room temperature to a ...
  • Solina, Danica; Cheary, Robert; Kalceff, Walter; Mccredie, Geoffrey (Elsevier Science Sa, 2005)
    An X-ray reflectivity study carried out on 45-450 angstrom films of radio frequency sputtered silicon oxide on silicon, with particular attention given to the interface between film and substrate. In order to model refectivity ...
  • Kucheyev, Sergei; Toth, Milos; Phillips, Matthew; Williams, Jim; Jagadish, Chennupati; Li, Gang (American Institute of Physics, 2002)
    Electrical isolation of n-type GaN epilayers bombarded with MeV light ions is studied by energy dispersive x-ray spectrometry (EDS). We show that the maximum bremsstrahlung x-ray energy (the Duane-Hunt limit) can be used ...