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Recent Submissions
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(CRC Press, Boca Raton, Florida, 2010)
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(Cambridge University Press, Cambridge, 2010)
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(Kluwer, The Netherlands, 2003)
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(Kluwer, The Netherlands, 2002)
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A Bayesian/Maximum Entropy Method for Certification of a NanocrystallineSize NIST Reference Material(Springer Verlag, Berlin Germany, 2004)
