Approximate Reliability Function Based On Wavelet Latin Hypercube Sampling And Bee Recurrent Neural Network
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| dc.contributor.author | Yeh Wei-Chang | en_US |
| dc.contributor.author | Su Jack | en_US |
| dc.contributor.author | Hsieh Tsung-Jung | en_US |
| dc.contributor.author | Chih Mingchang | en_US |
| dc.contributor.author | Liu Sin-Long | en_US |
| dc.contributor.editor | en_US | |
| dc.date.accessioned | 2012-02-02T09:56:16Z | |
| dc.date.available | 2012-02-02T09:56:16Z | |
| dc.date.issued | 2011 | en_US |
| dc.identifier | 2010004084 | en_US |
| dc.identifier.citation | Yeh Wei-Chang et al. 2011, 'Approximate Reliability Function Based On Wavelet Latin Hypercube Sampling And Bee Recurrent Neural Network', IEEE-Inst Electrical Electronics Engineers Inc, vol. 60, no. 2, pp. 404-414. | en_US |
| dc.identifier.issn | 0018-9529 | en_US |
| dc.identifier.other | C1 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10453/15173 | |
| dc.description.abstract | This work combines a Bee Recurrent Neural Network (BRNN) optimized by the Artificial Bee Colony (ABC) algorithm with Monte Carlo Simulation (MCS) to generate a novel approximate model for predicting network reliability. We utilize the Wavelet Transform ( | en_US |
| dc.language | en_US | |
| dc.publisher | IEEE-Inst Electrical Electronics Engineers Inc | en_US |
| dc.relation.isbasedon | http://dx.doi.org/10.1109/TR.2011.2134190 | en_US |
| dc.title | Approximate Reliability Function Based On Wavelet Latin Hypercube Sampling And Bee Recurrent Neural Network | en_US |
| dc.parent | IEEE Transactions on Reliability | en_US |
| dc.journal.volume | 60 | en_US |
| dc.journal.number | 2 | en_US |
| dc.publocation | Piscataway | en_US |
| dc.identifier.startpage | 404 | en_US |
| dc.identifier.endpage | 414 | en_US |
| dc.cauo.name | FEIT.Faculty of Engineering & Information Technology | en_US |
| dc.conference | Verified OK | en_US |
| dc.for | 080300 | en_US |
| dc.personcode | 106463;0000069317;0000069318;0000069319;0000069321 | en_US |
| dc.percentage | 000100 | en_US |
| dc.classification.name | Computer Software | en_US |
| dc.classification.type | FOR-08 | en_US |
| dc.edition | en_US | |
| dc.custom | en_US | |
| dc.date.activity | en_US | |
| dc.location.activity | ISI:000291317100006 | en_US |
| dc.description.keywords | Colony Abc Algorithm; Computer Experiments; Simulation Approach; Designs; Optimization; Performance | en_US |
| dc.staffid | en_US |
