A Revised Layered-Network Algorithm To Search For All D-Minpaths Of A Limited-Flow Acyclic Network

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dc.contributor.author Yeh, Wei-Chang en_US
dc.contributor.editor en_US
dc.date.accessioned 2012-02-02T09:48:37Z
dc.date.available 2012-02-02T09:48:37Z
dc.date.issued 1998 en_US
dc.identifier 2010004144 en_US
dc.identifier.citation Yeh Wei-Chang 1998, 'A Revised Layered-Network Algorithm To Search For All D-Minpaths Of A Limited-Flow Acyclic Network', IEEE-Inst Electrical Electronics Engineers Inc, vol. 47, no. 4, pp. 436-442. en_US
dc.identifier.issn 0018-9529 en_US
dc.identifier.other C1UNSUBMIT en_US
dc.identifier.uri http://hdl.handle.net/10453/15158
dc.description.abstract Many real-world systems are multistate and composed of multistate components in which the reliability can be computed in terms of the lower bound points of level d, called d-Minpaths (d-MP). Such systems (electric power, transportation, etc) may be regarded as flow networks whose arcs have statistically independent, discrete, limited, and multimlued random capacities. This study focuses on how to find the entire path of (GMP before calculating the reliability of an acyclic network. en_US
dc.language en_US
dc.publisher IEEE-Inst Electrical Electronics Engineers Inc en_US
dc.title A Revised Layered-Network Algorithm To Search For All D-Minpaths Of A Limited-Flow Acyclic Network en_US
dc.parent IEEE Transactions on Reliability en_US
dc.journal.volume 47 en_US
dc.journal.number 4 en_US
dc.publocation New York en_US
dc.identifier.startpage 436 en_US
dc.identifier.endpage 442 en_US
dc.cauo.name FEIT.Faculty of Engineering & Information Technology en_US
dc.conference Verified OK en_US
dc.for 080300 en_US
dc.personcode 106463 en_US
dc.percentage 100 en_US
dc.classification.name Computer Software en_US
dc.classification.type FOR-08 en_US
dc.edition en_US
dc.custom en_US
dc.date.activity en_US
dc.location.activity ISI:000079621800007 en_US
dc.description.keywords Limited-flow network, Layered network, d-Minpath en_US
dc.staffid en_US
dc.staffid 106463 en_US


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