Yadav N; Maheswaran S; Shutthanandan Vaithiyalingam; Thevuthasan Suntharampillai; Ngo Huu Hao; Vigneswaran Saravanamuth
(Elsevier Science, 2006)
To date, the trace elemental analysis of solids with inhomogeneous internal structure has been limited, particularly in the case of adsorbents. High-energy ion beam based particle induced X-ray emission (PIXE) is an ideal ...