Goldys Ewa; Godlewski Marek; Phillips Matthew; Butcher Kenneth; Baranowski Jacek; Pakula Krzysztof
(Widener University, 2007)
Scanning electron microscopy and cathodoluminescence (CL) in spot and depth-profiling modes
were used to evaluate the in-plane and in-depth uniformity of light emission from InGaN/GaN
quantum well (OW) structures. The ...