Kucheyev Sergei; Toth Milos; Phillips Matthew; Williams Jim; Jagadish Chennupati; Li Gang
(American Institute of Physics, 2002)
Electrical isolation of n-type GaN epilayers bombarded with MeV light ions is studied by energy
dispersive x-ray spectrometry (EDS). We show that the maximum bremsstrahlung x-ray energy (the
Duane–Hunt limit) can be used ...