Nonlinear Optical Properties Of Semiconducting Nanocrystals In Fused Silica
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| dc.contributor.author | Dowd Annette | en_US |
| dc.contributor.author | Samoc Marek | en_US |
| dc.contributor.author | Luther-Davies Barry | en_US |
| dc.contributor.author | Elliman Robert | en_US |
| dc.contributor.editor | en_US | |
| dc.date.accessioned | 2012-02-02T04:46:37Z | |
| dc.date.available | 2012-02-02T04:46:37Z | |
| dc.date.issued | 1999 | en_US |
| dc.identifier | 2006012898 | en_US |
| dc.identifier.citation | Dowd Annette et al. 1999, 'Nonlinear Optical Properties Of Semiconducting Nanocrystals In Fused Silica', Elsevier Science Bv, vol. 148, no. 1-4, pp. 964-968. | en_US |
| dc.identifier.issn | 0168-583X | en_US |
| dc.identifier.other | C1 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10453/14566 | |
| dc.description.abstract | Degenerate four-wave mixing (DFWM) is used to examine the nonlinear optical response of Ge nanocrystals in a silica matrix. The nanocrystals are formed by implanting 1.0 MeV Ge ions into silica to a dose of 3.0x10(17) Ge cm(-2) and annealing at 1100 degr | en_US |
| dc.language | en_US | |
| dc.publisher | Elsevier Science Bv | en_US |
| dc.relation.isbasedon | en_US | |
| dc.title | Nonlinear Optical Properties Of Semiconducting Nanocrystals In Fused Silica | en_US |
| dc.parent | Nuclear Instruments & Methods In Physics Research Section B-beam Interactions With Materials And Atoms | en_US |
| dc.journal.volume | 148 | en_US |
| dc.journal.number | 1-4 | en_US |
| dc.publocation | Amsterdam | en_US |
| dc.identifier.startpage | 964 | en_US |
| dc.identifier.endpage | 968 | en_US |
| dc.cauo.name | SCI.Physics and Advanced Materials | en_US |
| dc.conference | Verified OK | en_US |
| dc.for | 020500 | en_US |
| dc.personcode | 030626;0000030529;0000018213;0000021722 | en_US |
| dc.percentage | 000050 | en_US |
| dc.classification.name | Optical Physics | en_US |
| dc.classification.type | FOR-08 | en_US |
| dc.edition | en_US | |
| dc.custom | en_US | |
| dc.date.activity | en_US | |
| dc.location.activity | ISI:000078575700180 | en_US |
| dc.description.keywords | Thin-films | en_US |
| dc.staffid | Australian National University | en_US |
