Spectral Imaging and X-Ray Microanalysis with Multiple Detectors

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dc.contributor.author Moran, Ken en_US
dc.contributor.author Wuhrer, Ric en_US
dc.contributor.editor en_US
dc.date.accessioned 2010-06-16T04:57:36Z
dc.date.available 2010-06-16T04:57:36Z
dc.date.issued 2007 en_US
dc.identifier 2008004070 en_US
dc.identifier.citation Wuhrer Richard and Moran Ken 2007, 'Spectral Imaging and X-Ray Microanalysis with Multiple Detectors', Cambridge University Press, vol. 13, no. S2, pp. 1350-1351. en_US
dc.identifier.issn 1431-9276 en_US
dc.identifier.other C1UNSUBMIT en_US
dc.identifier.uri http://hdl.handle.net/10453/11783
dc.description.abstract We have progressively refined our requirements for high quality x-ray mapping, which has been a process of learning, advancing our hardware and redefining our requirements. Mapping is not a simple `one size fits all? scenario. There are still simple applications where dot mapping, especially with a wavelength dispersive spectrometer, can achieve the required results. The good thing about mapping is that there is always something new that can be learned and we are continually pushing back the boundaries of what can be achieved with mapping. It won?t be far into the future that we will have an electron microscope specifically set up to do live x-ray imaging, as we now do for electron imaging. The biggest problem we face is one of being able to determine the level of sophistication in our treatment of the data collected. As with automatic peak identification and standardless analysis it is very easy to produce bad results [1]. The good news is that if you are prepared to set your system up for high quality standards analysis, then most of these problems disappear. en_US
dc.language en_US
dc.publisher Cambridge University Press en_US
dc.title Spectral Imaging and X-Ray Microanalysis with Multiple Detectors en_US
dc.parent Microscopy & Microanalysis en_US
dc.journal.volume 13 en_US
dc.journal.number S2 en_US
dc.publocation UK en_US
dc.identifier.startpage 1350 en_US
dc.identifier.endpage 1351 en_US
dc.cauo.name SCI.Faculty of Science en_US
dc.conference Verified OK en_US
dc.for 020500 en_US
dc.personcode 880536 en_US
dc.personcode 0000022654 en_US
dc.percentage 100 en_US
dc.classification.name Optical Physics en_US
dc.classification.type FOR-08 en_US
dc.edition en_US
dc.custom en_US
dc.date.activity en_US
dc.location.activity en_US
dc.description.keywords NA en_US


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